- Additional Authors
- Description
- 1 v.
- Series Statement
- [NASA technical memorandum] ; NASA/TM-1999-209636
- Uniform Title
- NASA technical memorandum ; 209636.
- Subject
- Note
- Shipping list no.: 2000-0514-M.
- Reproduction (note)
- Call Number
- READEX Microfiche NAS 1.15:209636
- OCLC
- marcive43917959
- Author
Zhang, Nengli.
- Title
A new approach to measure contact angle and evaporation rate with flow visualization in a sessile drop [microform] / Nengli Zhang, David F. Chao.
- Imprint
[Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
- Series
[NASA technical memorandum] ; NASA/TM-1999-209636
NASA technical memorandum ; 209636.
- Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2000] 1 microfiche.
- Added Author
Chao, David F.
NASA Glenn Research Center.
- Gpo Item No.
0830-D (MF)
- Sudoc No.
NAS 1.15:209636
- Research Call Number
READEX Microfiche NAS 1.15:209636