Research Catalog
Proceedings International Test Conference 2002
- Title
- Proceedings International Test Conference 2002 / [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
- Author
- International Test Conference (33rd : 2002 : Baltimore, Maryland)
- Publication
- Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2002.
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 03-93 | Offsite |
Details
- Additional Authors
- Description
- xvi, 1250 p. : ill.; 29 cm.
- Alternative Title
- ITC : International Test Conference 2002 : proceedings : 7-10 October, 2002, Baltimore, MD, USA
- ITC : International Test Conference 2000
- Subject
- Note
- Conference number inferred.
- "IEEE Catalog Number 02CH37382"--verso of T.p.
- Bibliography (note)
- Includes bibliographic references and author index.
- Additional Formats (note)
- Also available via the World Wide Web.
- Call Number
- JSF 03-93
- ISBN
- 0780375424
- OCLC
- 50817727
- Conference
- International Test Conference (33rd : 2002 : Baltimore, Maryland)
- Title
- Proceedings International Test Conference 2002 / [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
- Imprint
- Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2002.
- Bibliography
- Includes bibliographic references and author index.
- Additional Formats
- Also available via the World Wide Web.
- Added Author
- IEEE Computer Society. Test Technology Technical Committee.Institute of Electrical and Electronics Engineers. Philadelphia Section.
- Cover Title
- ITC : International Test Conference 2002 : proceedings : 7-10 October, 2002, Baltimore, MD, USA
- Research Call Number
- JSF 03-93