Research Catalog

Proceedings International Test Conference 2002

Title: Proceedings International Test Conference 2002 / [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
Author: International Test Conference (33rd : 2002 : Baltimore, Maryland)
Publication: Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2002.

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Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	Text	Request in advance	JSF 03-93	Offsite

Details

Additional Authors

Description

xvi, 1250 p. : ill.; 29 cm.

Alternative Title

ITC : International Test Conference 2002 : proceedings : 7-10 October, 2002, Baltimore, MD, USA
ITC : International Test Conference 2000

Subjects

Note

Conference number inferred.
"IEEE Catalog Number 02CH37382"--verso of T.p.

Bibliography (note)

Includes bibliographic references and author index.

Additional Formats (note)

Also available via the World Wide Web.

Call Number

JSF 03-93

ISBN

0780375424

OCLC

50817727

Conference

International Test Conference (33rd : 2002 : Baltimore, Maryland)

Title

Proceedings International Test Conference 2002 / [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].

Imprint

Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2002.

Bibliography

Includes bibliographic references and author index.

Additional Formats

Also available via the World Wide Web.

Added Author

IEEE Computer Society. Test Technology Technical Committee.

Institute of Electrical and Electronics Engineers. Philadelphia Section.

Cover Title

ITC : International Test Conference 2002 : proceedings : 7-10 October, 2002, Baltimore, MD, USA

Research Call Number

JSF 03-93

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