- Additional Authors
- Description
- vi, 71 p. : ill.; 28 cm.
- Summary
- "This paper is an analysis of documentary standards related to dimensional metrology information, with recommendations regarding standards development"--P. 1.
- Series Statement
- NISTIR ; 6847
- Subject
- Note
- "December 19, 2001."
- Shipping list no.: 2002-0326-M.
- Bibliography (note)
- Includes bibliographical references (p. 71).
- Reproduction (note)
- Call Number
- GPO Microfiche C 13.58:6847
- OCLC
- marcive50136646
- Title
Analysis of dimensional metrology standards [microform] / John Evans ... [et al.].
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, [2001]
- Series
NISTIR ; 6847
- Bibliography
Includes bibliographical references (p. 71).
- Reproduction
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002. 1 microfiche : negative.
- Added Author
Evans, John M. (John Martin), 1942-
Manufacturing Engineering Laboratory (U.S.)
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0247-D (MF)
- Sudoc No.
C 13.58:6847
- Research Call Number
GPO Microfiche C 13.58:6847