- Additional Authors
- Description
- 19 p. : ill.; 28 cm.
- Series Statement
- NISTIR ; 6851
- Subject
- Note
- "January 2002."
- Shipping list no.: 2002-0384-M.
- Bibliography (note)
- Includes bibliographical references (p. 19).
- Reproduction (note)
- Call Number
- GPO Microfiche C 13.58:6851
- OCLC
- marcive50263005
- Title
Distributed testing of a device-level interface specification for a metrology system [microform] / John Horst ... [et al.].
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
- Series
NISTIR ; 6851
- Bibliography
Includes bibliographical references (p. 19).
- Reproduction
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002. 1 microfiche : negative.
- Added Author
Horst, John Albert.
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0247-D (MF)
- Sudoc No.
C 13.58:6851
- Research Call Number
GPO Microfiche C 13.58:6851