Research Catalog
Mustererkennung 1985 : 7. DAGM-Symposium, Erlangen, 24.-26. September 1985 : Proceedings
- Title
- Mustererkennung 1985 : 7. DAGM-Symposium, Erlangen, 24.-26. September 1985 : Proceedings / herausgegeben von H. Hiemann.
- Author
- DAGM (Organization). Symposium (7th : 1985 : Erlangen, Germany)
- Publication
- Berlin ; New York : Springer-Verlag, c1985.
Items in the Library & Off-site
Filter by
1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person. | Text | Use in library | ReCAP 12-17896 | Schwarzman Building - General Research Room 315 |
Details
- Additional Authors
- Niemann, Heinrich.
- Description
- xiii, 338 p. : ill.; 25 cm.
- Series Statement
- Informatik-Fachberichte ; 107
- Uniform Title
- Informatik-Fachberichte ; 107.
- Subject
- Pattern perception > Congresses
- Note
- English and German.
- Bibliography (note)
- Includes bibliographies.
- Call Number
- ReCAP 12-17896
- ISBN
- 0387156968 (U.S.)
- 9780387156965 (U.S.)
- 3540156968
- 9783540156963
- LCCN
- 86122911
- OCLC
- 14719520
- Author
- DAGM (Organization). Symposium (7th : 1985 : Erlangen, Germany)
- Title
- Mustererkennung 1985 : 7. DAGM-Symposium, Erlangen, 24.-26. September 1985 : Proceedings / herausgegeben von H. Hiemann.
- Imprint
- Berlin ; New York : Springer-Verlag, c1985.
- Series
- Informatik-Fachberichte ; 107Informatik-Fachberichte ; 107.
- Bibliography
- Includes bibliographies.
- Added Author
- Niemann, Heinrich.
- Other Form:
- Online version: DAGM. Symposium (7th : 1985 : Erlangen, Germany) Mustererkennung 1985. Berlin ; New York : Springer-Verlag, c1985 (OCoLC)609505368Online version: DAGM. Symposium (7th : 1985 : Erlangen, Germany) Mustererkennung 1985. Berlin ; New York : Springer-Verlag, c1985 (OCoLC)609505371
- Research Call Number
- ReCAP 12-17896