Research Catalog

ICMTS 94 : proceedings of the 1994 International Conference on Microelectronic Test Structures: March 22-25, 1994, San Diego California

Title
ICMTS 94 : proceedings of the 1994 International Conference on Microelectronic Test Structures: March 22-25, 1994, San Diego California / sponsored by the IEEE Electron Devices Society.
Author
IEEE International Conference on Microelectronic Test Structures (1994 : San Diego, Calif.)
Publication
[New York] : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : IEEE Service Center [distributor], c1994.

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Details

Additional Authors
IEEE Electron Devices Society.
Description
xi, 224 p. : ill.; 28 cm.
Alternative Title
  • Microelectronic test structures
  • Microelectronic Test Structures, 1994, ICMTS 1994, proceedings of the 1994 International Conference on.
Subject
  • Integrated circuits > Testing > Congresses
  • Semiconductors > Testing > Congresses
  • Transistors > Testing > Congresses
Note
  • "94CH3380-3."
Bibliography (note)
  • Includes bibliographical references and index.
Additional Formats (note)
  • Also available via the World Wide Web with additional title: Microelectronic Test Structures, 1994, ICMTS 1994, proceedings of the 1994 International Conference on.
Call Number
JSF 95-284
ISBN
  • 0780317572 (softbound)
  • 0780317580 (casebound)
  • 0780317599 (microfiche)
LCCN
93080496
OCLC
30636300
Conference
IEEE International Conference on Microelectronic Test Structures (1994 : San Diego, Calif.)
Title
ICMTS 94 : proceedings of the 1994 International Conference on Microelectronic Test Structures: March 22-25, 1994, San Diego California / sponsored by the IEEE Electron Devices Society.
Imprint
[New York] : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : IEEE Service Center [distributor], c1994.
Bibliography
Includes bibliographical references and index.
Additional Formats
Also available via the World Wide Web with additional title: Microelectronic Test Structures, 1994, ICMTS 1994, proceedings of the 1994 International Conference on.
Added Author
IEEE Electron Devices Society.
Added Title
Microelectronic Test Structures, 1994, ICMTS 1994, proceedings of the 1994 International Conference on.
Research Call Number
JSF 95-284
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