Research Catalog
ICMTS 94 : proceedings of the 1994 International Conference on Microelectronic Test Structures: March 22-25, 1994, San Diego California
- Title
- ICMTS 94 : proceedings of the 1994 International Conference on Microelectronic Test Structures: March 22-25, 1994, San Diego California / sponsored by the IEEE Electron Devices Society.
- Author
- IEEE International Conference on Microelectronic Test Structures (1994 : San Diego, Calif.)
- Publication
- [New York] : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : IEEE Service Center [distributor], c1994.
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Text | Request in advance | JSF 95-284 | Offsite |
Details
- Additional Authors
- IEEE Electron Devices Society.
- Description
- xi, 224 p. : ill.; 28 cm.
- Alternative Title
- Microelectronic test structures
- Microelectronic Test Structures, 1994, ICMTS 1994, proceedings of the 1994 International Conference on.
- Subject
- Note
- "94CH3380-3."
- Bibliography (note)
- Includes bibliographical references and index.
- Additional Formats (note)
- Also available via the World Wide Web with additional title: Microelectronic Test Structures, 1994, ICMTS 1994, proceedings of the 1994 International Conference on.
- Call Number
- JSF 95-284
- ISBN
- 0780317572 (softbound)
- 0780317580 (casebound)
- 0780317599 (microfiche)
- LCCN
- 93080496
- OCLC
- 30636300
- Conference
- IEEE International Conference on Microelectronic Test Structures (1994 : San Diego, Calif.)
- Title
- ICMTS 94 : proceedings of the 1994 International Conference on Microelectronic Test Structures: March 22-25, 1994, San Diego California / sponsored by the IEEE Electron Devices Society.
- Imprint
- [New York] : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : IEEE Service Center [distributor], c1994.
- Bibliography
- Includes bibliographical references and index.
- Additional Formats
- Also available via the World Wide Web with additional title: Microelectronic Test Structures, 1994, ICMTS 1994, proceedings of the 1994 International Conference on.
- Added Author
- IEEE Electron Devices Society.
- Added Title
- Microelectronic Test Structures, 1994, ICMTS 1994, proceedings of the 1994 International Conference on.
- Research Call Number
- JSF 95-284