- Additional Authors
- Series Statement
- NREL/SR ; 520-34826
- Uniform Title
- NREL/SR ; 520-34826.
- Alternative Title
- Medium range order in amorphous silicon measured by fluctuation electron microscopy
- Subject
- Amorphous semiconductors
- Note
- Title from title screen (viewed on June 7, 2004).
- System Details (note)
- Mode of access: Internet from the NREL web site. Address as of 6/7/04: http://www.nrel.gov/docs/fy04osti/34826.pdf; current access available via PURL.
- Call Number
- GPO Internet E 9.18:NREL/SR-520-34826
- OCLC
- marcive55606244
- Author
Voyles, P. M.
- Title
Medium-range order in amorphous silicon measured by fluctuation electron microscopy : final report, 23 June 1999-23 August 2002 / P.M. Voyles and J.R. Abelson.
- Publisher
Golden, Colo. : National Renewable Energy Laboratory, [2003]
- Type of Content
text
- Type of Medium
computer
- Type of Carrier
online resource
- Series
NREL/SR ; 520-34826
NREL/SR ; 520-34826.
- System Details
Mode of access: Internet from the NREL web site. Address as of 6/7/04: http://www.nrel.gov/docs/fy04osti/34826.pdf; current access available via PURL.
- Connect to:
- Added Author
Abelson, John Robert.
National Renewable Energy Laboratory (U.S.)
- Other Form:
Voyles, Paul Marriner, 1974- Medium-range order in amorphous silicon measured by fluctuation electron microscopy iv, 30 p. (OCoLC)53970012
- Gpo Item No.
0430-P-05 (online)
- Sudoc No.
E 9.18:NREL/SR-520-34826