Research Catalog

Programmable, automated transistor test system

Title
Programmable, automated transistor test system [microform] / Long V. Truong and Gale R. Sundburg.
Author
Truong, Long V.
Publication
[Washington, D.C.] : National Aeronautics and Space Administration, Scientific and Technical Information Branch ; Springfield, Va. : For sale by the National Technical Information Service, 1986.

Details

Additional Authors
  • Sundburg, Gale R.
  • United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch.
Description
1 v.
Series Statement
NASA technical paper ; 2554
Subject
  • Bipolar transistors > Testing > Computer programs
  • Metal oxide semiconductors > Testing > Computer programs
  • Transistors > Testing > Computer programs
  • Bipolar transistors
  • Field effect transistors
  • Performance tests
  • Software engineering
Reproduction (note)
  • Microfiche.
Call Number
GPO Microfiche NAS 1.60:2554
OCLC
marcive56611327
Author
Truong, Long V.
Title
Programmable, automated transistor test system [microform] / Long V. Truong and Gale R. Sundburg.
Imprint
[Washington, D.C.] : National Aeronautics and Space Administration, Scientific and Technical Information Branch ; Springfield, Va. : For sale by the National Technical Information Service, 1986.
Series
NASA technical paper ; 2554
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration,] 1986. 1 microfiche.
Added Author
Sundburg, Gale R.
United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch.
Gpo Item No.
0830-H-15 (MF)
Sudoc No.
NAS 1.60:2554
Research Call Number
GPO Microfiche NAS 1.60:2554
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