Research Catalog

ITC International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA

Title
ITC International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.
Author
International Test Conference (35th : 2004 : Charlotte, N.C.)
Publication
Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, c2004.

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Details

Additional Authors
  • IEEE Computer Society. Test Technology Technical Committee.
  • Institute of Electrical and Electronics Engineers. Philadelphia Section.
Description
xvi, 1459 p. : ill.; 27 cm.
Alternative Title
Test Conference, 2004, proceedings, International.
Subject
  • Integrated circuits > Testing > Congresses
  • Electronic digital computers > Circuits > Testing > Congresses
  • Telecommunication > Congresses
  • Radio frequency > Congresses
Note
  • Cover title.
  • "Conference 35 Years"--Cover.
  • "IEEE Catalog Number 04CH37586"--T.p. verso.
Bibliography (note)
  • Includes bibliographical references and author index.
Additional Formats (note)
  • Also issued online with additional title: Test Conference, 2004, proceedings, International.
Call Number
JSF 05-516
ISBN
0780385802
OCLC
56941586
Conference
International Test Conference (35th : 2004 : Charlotte, N.C.)
Title
ITC International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.
Imprint
Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, c2004.
Bibliography
Includes bibliographical references and author index.
Additional Formats
Also issued online with additional title: Test Conference, 2004, proceedings, International.
Connect to:
Restricted to IEEE Xplore subscribers
Added Author
IEEE Computer Society. Test Technology Technical Committee.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
Added Title
Test Conference, 2004, proceedings, International.
Research Call Number
JSF 05-516
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