Research Catalog

Image pattern recognition : synthesis and analysis in biometrics

Title: Image pattern recognition : synthesis and analysis in biometrics / editors, Svetlana N. Yanushkevich ... [et al.] ; consulting editor, Mark S. Nixon.
Publication: Singapore ; Hackensack, NJ : World Scientific, c2007.

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Additional Authors

Description

xxi, 430 p. : ill.; 24 cm.

Series Statement

Series in machine perception and artificial intelligence ; v. 67

Subjects

Note

"Some of the new ideas were first presented at the international workshop on 'Biometric Technologies: Modeling and Simulation' held in June 2004 in Calgary, Canada."--P. vi.

Bibliography (note)

Call Number

JSE 07-974

ISBN

OCLC

166766801

Title

Image pattern recognition : synthesis and analysis in biometrics / editors, Svetlana N. Yanushkevich ... [et al.] ; consulting editor, Mark S. Nixon.

Imprint

Singapore ; Hackensack, NJ : World Scientific, c2007.

Series

Series in machine perception and artificial intelligence ; v. 67

Bibliography

Includes bibliographical references and indexes.

Added Author

Yanushkevich, Svetlana N.

Nixon, Mark S.

Research Call Number

JSE 07-974