Research Catalog

Evaluation of a standard test method for total hemispherical emittance of surfaces from 293 K to 1673 K

Title
Evaluation of a standard test method for total hemispherical emittance of surfaces from 293 K to 1673 K [microform] / E. Conrad Compton.
Author
Compton, E. Conrad.
Publication
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1986]

Details

Additional Authors
Langley Research Center.
Description
1 v.
Series Statement
NASA technical memorandum ; 87681
Subject
  • Heat > Radiation and absorption
  • Heat resistant alloys
  • Emittance
  • Heat treatment
  • Surface properties
Reproduction (note)
  • Microfiche.
Call Number
GPO Microfiche NAS 1.15:87681
OCLC
marcive166373865
Author
Compton, E. Conrad.
Title
Evaluation of a standard test method for total hemispherical emittance of surfaces from 293 K to 1673 K [microform] / E. Conrad Compton.
Imprint
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1986]
Series
NASA technical memorandum ; 87681
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1986. 1 microfiche.
Added Author
Langley Research Center.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:87681
Research Call Number
GPO Microfiche NAS 1.15:87681
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