Research Catalog

Characterization of grain boudaries in silicon

Title
Characterization of grain boudaries in silicon [microform] / L.J. Cheng, ... [et al.] ; prepared for U.S. Department of Energy.
Publication
Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, [1983]

Details

Additional Authors
  • Cheng, L. J.
  • United States. Department of Energy.
  • Jet Propulsion Laboratory (U.S.)
Description
1 v.
Series Statement
  • JPL publication ; 83-87
  • NASA-CR ; 173459
Uniform Title
NASA contractor report ; NASA CR-173459.
Subject
  • Flat-plate Solar Array Project
  • Silicon
  • Grain boundaries
  • Electrical properties
  • Photoconductivity
  • Polycrystals
  • Spectroscopic analysis
Reproduction (note)
  • Microfiche.
Call Number
GPO Microfiche NAS 1.26:173459
OCLC
marcive180187178
Title
Characterization of grain boudaries in silicon [microform] / L.J. Cheng, ... [et al.] ; prepared for U.S. Department of Energy.
Imprint
Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, [1983]
Series
JPL publication ; 83-87
NASA-CR ; 173459
NASA contractor report ; NASA CR-173459.
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1984. 1 microfiche.
Added Author
Cheng, L. J.
United States. Department of Energy.
Jet Propulsion Laboratory (U.S.)
Gpo Item No.
0830-H-14 (MF)
Sudoc No.
NAS 1.26:173459
Research Call Number
GPO Microfiche NAS 1.26:173459
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