Research Catalog

A comparison of radiation damage in linear ICs from Cobalt-60 gamma rays and 2.2-MeV electrons

Title
A comparison of radiation damage in linear ICs from Cobalt-60 gamma rays and 2.2-MeV electrons [microform] / Michael K. Gauthier, Donald K. Nichols.
Author
Gauthier, Michael K.
Publication
Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, [1983]

Details

Additional Authors
  • Nichols, Donald K.
  • Jet Propulsion Laboratory (U.S.)
Description
1 v.
Series Statement
  • JPL publication ; 83-78
  • NASA CR ; 173474
Uniform Title
NASA contractor report ; NASA CR-173474.
Subject
  • Integrated circuits > Effect of radiation on
  • Amplifiers
  • Cobalt 60
  • Compton effect
  • Data processing
  • Gamma rays
  • Radiation damage
Reproduction (note)
  • Microfiche.
Call Number
GPO Microfiche NAS 1.26:173474
OCLC
marcive180696108
Author
Gauthier, Michael K.
Title
A comparison of radiation damage in linear ICs from Cobalt-60 gamma rays and 2.2-MeV electrons [microform] / Michael K. Gauthier, Donald K. Nichols.
Imprint
Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, [1983]
Series
JPL publication ; 83-78
NASA CR ; 173474
NASA contractor report ; NASA CR-173474.
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1984. 1 microfiche.
Added Author
Nichols, Donald K.
Jet Propulsion Laboratory (U.S.)
Gpo Item No.
0830-H-14 (MF)
Sudoc No.
NAS 1.26:173474
Research Call Number
GPO Microfiche NAS 1.26:173474
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