Research Catalog

The physics of a single-event upset in integrated circuits a review and critique of analytical models for charge collection

Title
The physics of a single-event upset in integrated circuits [microform] : a review and critique of analytical models for charge collection / Oldwig von Roos, John Zoutendyk.
Author
Roos, Oldwig von.
Publication
Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, [1983]

Details

Additional Authors
  • Zoutendyk, John.
  • Jet Propulsion Laboratory (U.S.)
Description
1 v.
Series Statement
  • JPL publication ; 83-79
  • NASA-CR ; 173471
Uniform Title
NASA contractor report ; NASA CR-173471.
Subject
  • Integrated circuits > Effect of radiation on
  • Galileo project
  • Holes (electron deficiencies)
  • Jupiter (planet)
  • Plasma physics
  • Radiation belts
Reproduction (note)
  • Microfiche.
Call Number
GPO Microfiche NAS 1.26:173471
OCLC
marcive180696064
Author
Roos, Oldwig von.
Title
The physics of a single-event upset in integrated circuits [microform] : a review and critique of analytical models for charge collection / Oldwig von Roos, John Zoutendyk.
Imprint
Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, [1983]
Series
JPL publication ; 83-79
NASA-CR ; 173471
NASA contractor report ; NASA CR-173471.
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1984. 1 microfiche.
Added Author
Zoutendyk, John.
Jet Propulsion Laboratory (U.S.)
Gpo Item No.
0830-H-14 (MF)
Sudoc No.
NAS 1.26:173471
Research Call Number
GPO Microfiche NAS 1.26:173471
View in Legacy Catalog