- Additional Authors
- Langley Research Center.
- Description
- 1 v.
- Series Statement
- NASA technical memorandum ; 85822
- Subject
- Reproduction (note)
- Call Number
- GPO Microfiche NAS 1.15:85822
- OCLC
- marcive232255292
- Author
Carreño, Victor A., 1956-
- Title
Upset susceptibility study employing circuit analysis and digital simulation [microform] / Victor A. Carreno.
- Imprint
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1984]
- Series
NASA technical memorandum ; 85822
- Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1984. 1 microfiche.
- Added Author
Langley Research Center.
- Gpo Item No.
0830-D (MF)
- Sudoc No.
NAS 1.15:85822
- Research Call Number
GPO Microfiche NAS 1.15:85822