Research Catalog

Measurement of the configuration of a concave surface by the interference of reflected light

Title
Measurement of the configuration of a concave surface by the interference of reflected light [microform] / Tetsuo Kumazawa, Tatsuji Sakamoto, and Shigeru Shida.
Author
Kumazawa, Tetsuo.
Publication
Washington, D.C. : National Aeronautics and Space Administration, [1985]

Details

Additional Authors
  • Sakamoto, Tatsuji.
  • Shida, Shigeru.
  • United States. National Aeronautics and Space Administration.
Description
1 v.
Series Statement
NASA technical memorandum ; NASA TM-77796
Subject
  • Optical pattern recognition
  • Concavity
  • Light (visible radiation)
  • Numerical analysis
  • Optical paths
  • Reflection
  • Semiconductor devices
  • Surface properties
  • Wave diffraction
Reproduction (note)
  • Microfiche.
Call Number
GPO Microfiche NAS 1.15:77796
OCLC
marcive234236769
Author
Kumazawa, Tetsuo.
Title
Measurement of the configuration of a concave surface by the interference of reflected light [microform] / Tetsuo Kumazawa, Tatsuji Sakamoto, and Shigeru Shida.
Imprint
Washington, D.C. : National Aeronautics and Space Administration, [1985]
Series
NASA technical memorandum ; NASA TM-77796
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1985]. 1 microfiche.
Added Author
Sakamoto, Tatsuji.
Shida, Shigeru.
United States. National Aeronautics and Space Administration.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:77796
Research Call Number
GPO Microfiche NAS 1.15:77796
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