Research Catalog

Title

The AXAF technology program [microform] : The optical flats tests / A.C. Williams ... [et al.].

Publication

[ Huntsville, Ala.] : National Aeronautics and Space Administration, George C. Marshall Space Flight Center, [1984]

Details

Additional Authors

• Williams, A. C.
• George C. Marshall Space Flight Center.

Description

1 v.

Series Statement

NASA technical memorandum ; NASA TM-82570

Uniform Title

NASA technical memorandum ; 82570.

Alternative Title

Optical flats tests

Subject

• X-ray telescopes
• Microanalysis
• Mirrors
• Optical measurement
• Optical properties
• Polishing
• Reflectance
• Surface finishing
• Surface roughness
• X ray analysis
• X Ray Astrophysics Facility
• X ray scattering
• X ray telescopes

Reproduction (note)

• Microfiche.

Call Number

GPO Microfiche NAS 1.15:82570

OCLC

marcive237789684

Title

The AXAF technology program [microform] : The optical flats tests / A.C. Williams ... [et al.].

Imprint

[ Huntsville, Ala.] : National Aeronautics and Space Administration, George C. Marshall Space Flight Center, [1984]

Series

NASA technical memorandum ; NASA TM-82570

NASA technical memorandum ; 82570.

Reproduction

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1984]. 1 microfiche.

Added Author

Williams, A. C.

George C. Marshall Space Flight Center.

Gpo Item No.

0830-D (MF)

Sudoc No.

NAS 1.15:82570

Research Call Number

GPO Microfiche NAS 1.15:82570