Research Catalog

Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride

Title
Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride [microform] / George Y. Baaklini, James D. Kiser, and Don J. Roth.
Author
Baaklini, George Y.
Publication
[Washington, D.C.] : National Aeronautics and Space Administration, [1985]

Details

Additional Authors
  • Kiser, James D.
  • Roth, Don J.
  • United States. National Aeronautics and Space Administration.
Description
1 v.
Series Statement
NASA technical memorandum ; 86945
Uniform Title
NASA technical memorandum ; 86945.
Subject
  • Detection
  • Radiography
  • Reaction bonding
  • Sensitivity
  • Silicon carbides
  • Silicon nitrides
Reproduction (note)
  • Microfiche.
Call Number
GPO Microfiche NAS 1.15:86945
OCLC
marcive265697166
Author
Baaklini, George Y.
Title
Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride [microform] / George Y. Baaklini, James D. Kiser, and Don J. Roth.
Imprint
[Washington, D.C.] : National Aeronautics and Space Administration, [1985]
Series
NASA technical memorandum ; 86945
NASA technical memorandum ; 86945.
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1985. 1 microfiche.
Added Author
Kiser, James D.
Roth, Don J.
United States. National Aeronautics and Space Administration.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:86945
Research Call Number
GPO Microfiche NAS 1.15:86945
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