- Additional Authors
- Description
- iv, 14 pages : digital, PDF file.
- Series Statement
- ARL-TR ; 4378
- Uniform Title
- ARL-TR (Aberdeen Proving Ground, Md.) ; 4378.
- Alternative Title
- Thermal characterization of thin films for microelectromechanical systems applications
- Subject
- Microelectromechanical systems
- Note
- Title from title screen (viewed on May 26, 2009).
- "February 2008."
- System Details (note)
- Mode of access: Internet from the ARL web site. Address as of 5/26/09: http://www.arl.army.mil/arlreports/2008/ARL-TR-4378.pdf; current access is available via PURL.
- Call Number
- GPO Internet D 101.133:4378
- OCLC
- marcive351779555
- Author
Howe, David J.
- Title
Thermal characterization of thin films for MEMS applications / by David J. Howe and Brian Morgan.
- Publisher
Adelphi, Md. : Army Research Laboratory, [2008]
- Type of Content
text
- Type of Medium
computer
- Type of Carrier
online resource
- Series
ARL-TR ; 4378
ARL-TR (Aberdeen Proving Ground, Md.) ; 4378.
- System Details
Mode of access: Internet from the ARL web site. Address as of 5/26/09: http://www.arl.army.mil/arlreports/2008/ARL-TR-4378.pdf; current access is available via PURL.
- Connect to:
- Added Author
Morgan, Brian.
U.S. Army Research Laboratory.
- Gpo Item No.
0324-A-01 (online)
- Sudoc No.
D 101.133:4378