Research Catalog

Manhattan picture worlds : Thomas Wrede

Title
Manhattan picture worlds : Thomas Wrede / mit Texten von Christoph Schaden, Marshall Berman.
Author
Wrede, Thomas, 1963-
Publication
Bielefeld : Kerber, 2009.

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StatusFormatAccessCall NumberItem Location
TextUse in library MFX+ (Wrede) 11-1785Schwarzman Building - Art and Architecture Room 300

Details

Additional Authors
  • Schaden, Christoph.
  • Berman, Marshall, 1940-
  • Beck & Eggeling.
Description
115 p. : col. ill.; 32 cm.
Series Statement
Kerber photoart
Uniform Title
Kerber photoart.
Subject
Wrede, Thomas, 1963- > Exhibitions
Note
  • Published in conjunction with an exhibition at Beck & Eggeling, Dusseldorf, Germany, Mar. 5-Apr. 25, 2009.
Language (note)
  • Texts in German and English.
Call Number
MFX+ (Wrede) 11-1785
ISBN
  • 9783866782440 (hd.bd.)
  • 3866782446 (hd.bd.)
OCLC
317453164
Author
Wrede, Thomas, 1963-
Title
Manhattan picture worlds : Thomas Wrede / mit Texten von Christoph Schaden, Marshall Berman.
Imprint
Bielefeld : Kerber, 2009.
Series
Kerber photoart
Kerber photoart.
Language
Texts in German and English.
Added Author
Schaden, Christoph.
Berman, Marshall, 1940-
Beck & Eggeling.
Research Call Number
MFX+ (Wrede) 11-1785
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