Research Catalog
Effluent and environmental radiation surveillance : a symposium
- Title
- Effluent and environmental radiation surveillance : a symposium / sponsored by ASTM Committee D-22 on Methods of Sampling and Analysis of Atmospheres and Committee D-19 on Water, American Society for Testing and Materials, Johnson, Vt., 9-14 July 1978 ; J.J. Kelly, editor.
- Publication
- Philadelphia, Pa. : ASTM, c1980.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | VEE (American Society for Testing Materials. Special technical publication. no. 698) | Offsite |
Details
- Additional Authors
- Description
- 364 p. : ill.; 24 cm.
- Series Statement
- ASTM special technical publication ; 698
- Uniform Title
- ASTM special technical publication ; 698.
- Subjects
- Bibliography (note)
- Includes bibliographical references and index.
- Additional Formats (note)
- Also issued online.
- Call Number
- VEE (American Society for Testing Materials. Special technical publication. no. 698)
- ISBN
- 0469800035 (canceled/invalid)
- LCCN
- 79054722
- OCLC
- 6207778
- Title
- Effluent and environmental radiation surveillance : a symposium / sponsored by ASTM Committee D-22 on Methods of Sampling and Analysis of Atmospheres and Committee D-19 on Water, American Society for Testing and Materials, Johnson, Vt., 9-14 July 1978 ; J.J. Kelly, editor.
- Imprint
- Philadelphia, Pa. : ASTM, c1980.
- Series
- ASTM special technical publication ; 698ASTM special technical publication ; 698.
- Bibliography
- Includes bibliographical references and index.
- Additional Formats
- Also issued online.
- Added Author
- Kelly, J. J. (John Joseph), 1941-American Society for Testing and Materials. Committee D-22 on Methods of Sampling and Analysis of Atmospheres.American Society for Testing and Materials. Committee D-19 on Water.
- Other Form:
- Online version: Effluent and environmental radiation surveillance. Philadelphia, Pa. : ASTM, c1980 (OCoLC)566306153
- Research Call Number
- VEE (American Society for Testing Materials. Special technical publication. no. 698)