Research Catalog

Adhesion measurement of thin films, thick films, and bulk coatings : a symposium presented at ASTM headquarters, American Society for Testing and Materials, Philadelphia, Pa., 2-4 Nov. 1976

Title: Adhesion measurement of thin films, thick films, and bulk coatings : a symposium presented at ASTM headquarters, American Society for Testing and Materials, Philadelphia, Pa., 2-4 Nov. 1976 / K.L. Mittal, editor.
Author: Symposium on Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings (1976 : Philadelphia, Pa.)
Publication: Philadelphia : The Society, c1978.

Available Online

Items in the Library & Off-site

Filter by

1 Item

Item details
Status	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	Text	Request in advance	VEE (American Society for Testing Materials. Special technical publication. no. 640)	Offsite

Details

Additional Authors

Description

402 p. : ill.; 24 cm.

Series Statement

ASTM special technical publication ; 640

Uniform Title

ASTM special technical publication ; 640.

Subjects

Bibliography (note)

Includes bibliographical references and index.

Call Number

VEE (American Society for Testing Materials. Special technical publication. no. 640)

ISBN

0464000025
9780464000020

LCCN

77084460

OCLC

4210816

Conference

Symposium on Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings (1976 : Philadelphia, Pa.)

Title

Adhesion measurement of thin films, thick films, and bulk coatings : a symposium presented at ASTM headquarters, American Society for Testing and Materials, Philadelphia, Pa., 2-4 Nov. 1976 / K.L. Mittal, editor.

Imprint

Philadelphia : The Society, c1978.

Series

ASTM special technical publication ; 640

ASTM special technical publication ; 640.

Bibliography

Includes bibliographical references and index.

Connect to:

Table of contents

Added Author

Mittal, K. L., 1945-

American Society for Testing and Materials.

Research Call Number

VEE (American Society for Testing Materials. Special technical publication. no. 640)

View in Legacy Catalog