Research Catalog

Fatigue at elevated temperatures

Title
Fatigue at elevated temperatures / A.E. Carden, A.J. McEvily, and C.H. Wells, editors.
Publication
Philadelphia : American Society for Testing and Materials, [1973]

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Details

Additional Authors
  • Carden, A. E.
  • McEvily, A. J.
  • Wells, Clifford H.
  • ASTM Committee E-9 on Fatigue.
  • American Society of Mechanical Engineers. Materials Division.
  • American Society for Metals. Materials Systems and Design Division.
Description
ix, 801 p. illus.; 24 cm.
Series Statement
ASTM special technical publication, 520
Uniform Title
ASTM special technical publication ; 520.
Subject
  • Metals > Fatigue > Congresses
  • Metals > Effect of high temperatures on > Congresses
Note
  • A symposium presented at the University of Connecticut, Storrs, June 18-23, 1972, and sponsored by Committee E-9 on Fatigue of the American Society for Testing and Materials in cooperation with the American Society of Mechanical Engineers (Materials Division) and the American Society for Metals (Materials Systems and Design Division).
Bibliography (note)
  • Includes bibliographical references.
Additional Formats (note)
  • Also issued online.
Call Number
VEE ( American Society for Testing and Materials. Special technical publication. STP 520)
LCCN
73076958
OCLC
762676
Title
Fatigue at elevated temperatures / A.E. Carden, A.J. McEvily, and C.H. Wells, editors.
Imprint
Philadelphia : American Society for Testing and Materials, [1973]
Series
ASTM special technical publication, 520
ASTM special technical publication ; 520.
Bibliography
Includes bibliographical references.
Additional Formats
Also issued online.
Added Author
Carden, A. E.
McEvily, A. J.
Wells, Clifford H.
ASTM Committee E-9 on Fatigue.
American Society of Mechanical Engineers. Materials Division.
American Society for Metals. Materials Systems and Design Division.
Other Form:
Online version: Fatigue at elevated temperatures. Philadelphia, American Society for Testing and Materials [1973] (OCoLC)596437429
Research Call Number
VEE ( American Society for Testing and Materials. Special technical publication. STP 520)
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