Research Catalog
Fatigue at elevated temperatures
- Title
- Fatigue at elevated temperatures / A.E. Carden, A.J. McEvily, and C.H. Wells, editors.
- Publication
- Philadelphia : American Society for Testing and Materials, [1973]
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | VEE ( American Society for Testing and Materials. Special technical publication. STP 520) | Offsite |
Details
- Additional Authors
- Description
- ix, 801 p. illus.; 24 cm.
- Series Statement
- ASTM special technical publication, 520
- Uniform Title
- ASTM special technical publication ; 520.
- Subject
- Note
- A symposium presented at the University of Connecticut, Storrs, June 18-23, 1972, and sponsored by Committee E-9 on Fatigue of the American Society for Testing and Materials in cooperation with the American Society of Mechanical Engineers (Materials Division) and the American Society for Metals (Materials Systems and Design Division).
- Bibliography (note)
- Includes bibliographical references.
- Additional Formats (note)
- Also issued online.
- Call Number
- VEE ( American Society for Testing and Materials. Special technical publication. STP 520)
- LCCN
- 73076958
- OCLC
- 762676
- Title
- Fatigue at elevated temperatures / A.E. Carden, A.J. McEvily, and C.H. Wells, editors.
- Imprint
- Philadelphia : American Society for Testing and Materials, [1973]
- Series
- ASTM special technical publication, 520ASTM special technical publication ; 520.
- Bibliography
- Includes bibliographical references.
- Additional Formats
- Also issued online.
- Added Author
- Carden, A. E.McEvily, A. J.Wells, Clifford H.ASTM Committee E-9 on Fatigue.American Society of Mechanical Engineers. Materials Division.American Society for Metals. Materials Systems and Design Division.
- Other Form:
- Online version: Fatigue at elevated temperatures. Philadelphia, American Society for Testing and Materials [1973] (OCoLC)596437429
- Research Call Number
- VEE ( American Society for Testing and Materials. Special technical publication. STP 520)