Research Catalog

Applications of electron microfractography to materials research.

Title
Applications of electron microfractography to materials research.
Author
Symposium on Applications of Electron Microfractography to Materials Research (1970 : Toronto)
Publication
Philadelphia : American Society for Testing and Materials, [1971]

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
TextRequest in advance VEE (American Society for Testing and Materials. Special technical publication, [no.] 493)Offsite

Details

Additional Authors
American Society for Testing and Materials. Subcommittee II on Fractography.
Description
96 p. illus.; 23 cm.
Series Statement
ASTM special technical publication 493
Subjects
Note
  • "Presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970."
  • Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals.
Bibliography (note)
  • Includes bibliographical references.
Additional Formats (note)
  • Also issued online.
Call Number
VEE (American Society for Testing and Materials. Special technical publication, [no.] 493)
LCCN
70155959
OCLC
296447
Conference
Symposium on Applications of Electron Microfractography to Materials Research (1970 : Toronto)
Title
Applications of electron microfractography to materials research.
Imprint
Philadelphia : American Society for Testing and Materials, [1971]
Series
ASTM special technical publication 493
Bibliography
Includes bibliographical references.
Additional Formats
Also issued online.
Added Author
American Society for Testing and Materials. Subcommittee II on Fractography.
Other Form:
Online version: Symposium on Applications of Electron Microfractography to Materials Research (1970 : Toronto) Applications of electron microfractography to materials research. Philadelphia, American Society for Testing and Materials [1971] (OCoLC)596402480
Research Call Number
VEE (American Society for Testing and Materials. Special technical publication, [no.] 493)
View in Legacy Catalog