Research Catalog
Sampling, standards, and homogeneity : a symposium presented at the seventy-fifth annual meeting, American Society for Testing and Materials, Los Angeles, Calif., 25-30 June, 1972
- Title
- Sampling, standards, and homogeneity : a symposium presented at the seventy-fifth annual meeting, American Society for Testing and Materials, Los Angeles, Calif., 25-30 June, 1972 / W.R. Kennedy, symposium chairman. J.F. Woodruff, co-chairman.
- Author
- Symposium on Sampling, Standards, and Homogeneity (1972 : Los Angeles, Calif.)
- Publication
- Philadelphia : American Society for Testing and Materials, [c1973]
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Status | Format | Access | Call Number | Item Location |
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Text | Request in advance | VEE (American Society for Testing and Materials. Special technical publication, [no.] 540) | Offsite |
Details
- Additional Authors
- Description
- 131 p. illus.; 24 cm.
- Series Statement
- ASTM special technical publication ; 540
- Uniform Title
- ASTM special technical publication ; 540.
- Subjects
- Note
- "Sponsored by ASTM Committee E-2 on Emission Spectroscopy."
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- VEE (American Society for Testing and Materials. Special technical publication, [no.] 540)
- LCCN
- 73080190
- OCLC
- 821063
- Conference
- Symposium on Sampling, Standards, and Homogeneity (1972 : Los Angeles, Calif.)
- Title
- Sampling, standards, and homogeneity : a symposium presented at the seventy-fifth annual meeting, American Society for Testing and Materials, Los Angeles, Calif., 25-30 June, 1972 / W.R. Kennedy, symposium chairman. J.F. Woodruff, co-chairman.
- Imprint
- Philadelphia : American Society for Testing and Materials, [c1973]
- Series
- ASTM special technical publication ; 540ASTM special technical publication ; 540.
- Bibliography
- Includes bibliographical references.
- Added Author
- Kennedy, W. R.Woodruff, Joseph Franklin, 1913-American Society for Testing and Materials.ASTM Committee E-2 on Emission Spectroscopy.
- Research Call Number
- VEE (American Society for Testing and Materials. Special technical publication, [no.] 540)