Research Catalog
Energy dispersion X-ray analysis: X-ray and electron probe analysis
- Title
- Energy dispersion X-ray analysis: X-ray and electron probe analysis / J.C. Russ, coordinator.
- Author
- Symposium on Energy Dispersion X-ray Analysis: X-ray and Electron Probe Analysis (1970 : Toronto)
- Publication
- Philadelphia : American Society for Testing and Materials, [1971]
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | VEE (American Society for Testing and Materials. Special technical publication, no. 485) | Offsite |
Details
- Additional Authors
- American Society for Testing and Materials. Committee E-4 on Metallography.
- Description
- 285 p. illus.; 24 cm.
- Series Statement
- ASTM special technical publication ; 485
- Uniform Title
- ASTM special technical publication ; 485.
- Subjects
- Note
- "A symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970."
- Sponsored by the ASTM Committee E-4 on Metallography.
- Bibliography (note)
- Includes bibliographical references.
- Contents
- X-ray energy spectrometry in the 0.1 to 10 Å range / Ray Fitzgerald and Peter Gantzel -- The future of silicon X-ray detectors / D. W. Aitken and E. Woo -- Low-noise cryogenic preamplifiers / Emanuel Elad -- Characterization of semiconductor X-ray energy spectrometers / F. J. Walter -- Energy dispersion X-ray analysis with electron and isotope excitation / A. O. Sandborg -- Role of multichannel analyzer in data handling / Garry Williams -- Solid-state X-ray detectors for electron microprobe / Eric Lifshin -- Energy dispersion X-ray analysis on the scanning electron microscope / J. C. Russ -- Energy dispersion X-ray analysis with the transmission electron microscope / S. L. Bender and R. H. Duff -- Role of the gas flow proportional counter in energy dispersive analysis / L. V. Sutfin and R. E. Ogilvie -- Light element analysis using the semiconductor X-ray energy spectrometer with electron excitation / J. C. Russ -- Rapid quantitative electron probe microanalysis with a nondiffractive detector system / R. L. Myklebust and K. F. J. Heinrich -- Design and application of X-ray emission analyzers using radioisotope X-ray or gamma ray sources / J. R. Rhodes.
- Call Number
- VEE (American Society for Testing and Materials. Special technical publication, no. 485)
- ISBN
- 0803100701
- 9780803100701
- LCCN
- 72137455
- OCLC
- 151408
- Conference
- Symposium on Energy Dispersion X-ray Analysis: X-ray and Electron Probe Analysis (1970 : Toronto)
- Title
- Energy dispersion X-ray analysis: X-ray and electron probe analysis / J.C. Russ, coordinator.
- Imprint
- Philadelphia : American Society for Testing and Materials, [1971]
- Series
- ASTM special technical publication ; 485ASTM special technical publication ; 485.
- Bibliography
- Includes bibliographical references.
- Added Author
- American Society for Testing and Materials. Committee E-4 on Metallography.
- Other Form:
- Online version: Symposium on Energy Dispersion X-ray Analysis: X-ray and Electron Probe Analysis (1970 : Toronto) Energy dispersion X-ray analysis: X-ray and electron probe analysis. Philadelphia, American Society for Testing and Materials [1971] (OCoLC)768017998
- Research Call Number
- VEE (American Society for Testing and Materials. Special technical publication, no. 485)