Research Catalog

Title

Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate / Hyun Jung Kim ... [and others].

Publication

Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]

Details

Additional Authors

• Kim, Hyŏn-jŏng.
• Langley Research Center.

Description

1 online resource (ix, 29 pages) : illustrations (some color).

Series Statement

NASA/TM ; 2012-217597

Uniform Title

NASA technical memorandum ; 2012-217597.

Alternative Title

Transmission electron microscopy (TEM) sample preparation of Si1-xGex in c-plane sapphire substrate

Subject

• Ion beams
• Sapphire
• Transmission electron microscopy
• X ray diffraction
• Single crystals
• Rhombohedrons
• Germanium
• Density measurement
• Crystal structure

Note

• Title from title screen (viewed on Nov. 7, 2012).
• "August 2012."

Bibliography (note)

• Includes bibliographical references (page 29).

Funding (note)

• Sponsored by National Aeronautics and Space Administration

Call Number

GPO Internet NAS 1.15:2012-217597

OCLC

marcive816311040

Title

Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate / Hyun Jung Kim ... [and others].

Publisher

Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]

Type of Content

text

Type of Medium

computer

Type of Carrier

online resource

Series

NASA/TM ; 2012-217597

NASA technical memorandum ; 2012-217597.

Bibliography

Includes bibliographical references (page 29).

Funding

Sponsored by National Aeronautics and Space Administration 392259.02.07.9923.11

L-20166

Connect to:

https://purl.fdlp.gov/GPO/gpo30968

Added Author

Kim, Hyŏn-jŏng.

Langley Research Center.

Gpo Item No.

0830-D (online)

Sudoc No.

NAS 1.15:2012-217597