- Additional Authors
- Description
- 1 microfiche (11 unnumbered pages) : negative, illustrations; 11 x 15 cm.
- Summary
- "Temperature profiles for silicon ribbon are presented. Ribbon dislocations and elastic stress are discussed. Ribbon quality is important for the ribbon's function as a solar cell."--NTIS abstract.
- Series Statement
- NASA CR ; 175459
- JPL technical report ; no. 956571-1
- Uniform Title
- NASA contractor report ; NASA CR-175459.
- JPL technical report ; no. 956571-1.
- Subject
- Note
- Funding (note)
- Sponsored by the National Aeronautics and Space Administration
- Call Number
- GPO Microfiche NAS 1.26:175459
- OCLC
- marcive182729509
- Author
Dillon, O. W., author.
- Title
Stress-strain analysis of silicon ribbon / by O.W. Dillon, Jr., principal investigator.
- Publisher
[Lexington, Kentucky] : University of Kentucky Research Foundation ; [Pasadena, California] : California Institute of Technology, Jet Propulsion Laboratory, 1985.
- Type of Content
text
- Type of Medium
microform
- Type of Carrier
microfiche
- Series
NASA CR ; 175459
JPL technical report ; no. 956571-1
NASA contractor report ; NASA CR-175459.
JPL technical report ; no. 956571-1.
- Funding
Sponsored by the National Aeronautics and Space Administration 956571 JPL-9950-998
- Added Author
University of Kentucky. Research Foundation, author.
Jet Propulsion Laboratory (U.S.), issuing body.
United States. National Aeronautics and Space Administration, sponsoring body.
- Other Form:
Online version: Dillon, O. W. Stress-strain analysis of silicon ribbon (OCoLC)880587761
- Gpo Item No.
0830-H-14 (MF)
- Sudoc No.
NAS 1.26:175459