- Additional Authors
- Description
- 1 online resource (16 pages, 3 unnumbered pages) : illustrations.
- Series Statement
- NASA-CR ; 175156
- Uniform Title
- NASA contractor report ; NASA CR-175156.
- Alternative Title
- Instrumemtation and measurement of index of refraction
- Subjects
- Note
- Title from title screen (viewed on Sept. 11, 2014).
- "11 July 1993."
- Bibliography (note)
- Includes bibliographical references (pages 7-9).
- Type of Report (note)
- Funding (note)
- Sponsored by the National Aeronautics and Space Administration
- Call Number
- GPO Internet NAS 1.26:175156
- OCLC
- marcive890408997
- Author
Lally, J., author.
- Title
Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction) / principal investigators : J. Lally and R. Meister.
- Publisher
[Washington, D.C.] : Department of Electrical Engineering, Catholic University of America : National Aeronautics and Space Administration, 11 July 1993.
- Type of Content
text
- Type of Medium
computer
- Type of Carrier
online resource
- Series
NASA-CR ; 175156
NASA contractor report ; NASA CR-175156.
- Bibliography
Includes bibliographical references (pages 7-9).
- Type Of Report
Final report; August 1977-August 1980.
- Funding
Sponsored by the National Aeronautics and Space Administration NSG-5111
- Connect to:
- Added Author
Meister, R., author.
Catholic University of America. Department of Electrical Engineering, issuing body.
United States. National Aeronautics and Space Administration, sponsoring body.
- Other Form:
Microfiche version: Lally, J. Properties of material in the submillimeter wave region (instrumentation and measurement of index of refraction) (OCoLC)793520447
- Gpo Item No.
0830-H-14 (online)
- Sudoc No.
NAS 1.26:175156