- Additional Authors
- Description
- 1 microfiche ([4], 83 pages) : negative, illustrations; 11 x 15 cm.
- Summary
- "Temperature gradient zone melting process was used to form p-n junctions in bulk of high purity silicon wafers. These diodes were patterned to form arrays for X-ray spectrometers. The whole fabrication processes for these X-ray detectors are reviewed in detail. The p-n junctions were evaluated by (1) the dark diode I-V measurements, (2) the diode C sub I - V measurements, and (3) the MOS C-V measurements. The results showed that these junctions were linearly graded in charge distribution with low reverse bias leakage current flowing through them (few nA at -10 volts). The X-ray detection experiments showed that an FWHM of 500 eV was obtained from these diodes with a small bias of just -5 volts (for X-ray source Fe55). A theoretical model was proposed to explain the extra peaks found in the energy spectra and a very interesting point - cross talk effect was pointed out. This might be a solution to the problem of making really high resolution X-ray spectrometers."
- Series Statement
- NASA CR ; 175178
- Uniform Title
- NASA contractor report ; NASA CR-175178.
- Subject
- Note
- Bibliography (note)
- Includes bibliographical references (pages 76-78).
- Type of Report (note)
- Funding (note)
- Sponsored by the NASA/Goddard Space Flight Center
- Call Number
- GPO Microfiche NAS 1.26:175178
- OCLC
- marcive245977553
- Author
Zemel, Jay N., author.
- Title
Deep diode arrays for X-ray detection / principal investigator, Jay N. Zemel.
- Publisher
Philadelphia, Pennsylvania : University of Pennsylvania, The Moore School of Electrical Engineering ; Greenbelt, Maryland : NASA/Goddard Space Flight Center, 29 January 1984.
- Type of Content
text
- Type of Medium
microform
- Type of Carrier
microfiche
- Series
NASA CR ; 175178
NASA contractor report ; NASA CR-175178.
- Bibliography
Includes bibliographical references (pages 76-78).
- Type Of Report
Final report.
- Funding
Sponsored by the NASA/Goddard Space Flight Center NAS-5-27285
- Indexed Term
NASA keywords: X ray spectroscopy - Arrays - Diodes - P-n junctions - Energy spectra - Bias - Temperature gradients - Silicon - Wafers - Melting
- Added Author
Moore School of Electrical Engineering, issuing body.
Goddard Space Flight Center, sponsoring body.
United States. National Aeronautics and Space Administration.
- Other Form:
Online version: Zemel, Jay N. Deep diode arrays for X-ray detection (OCoLC)890478989
- Gpo Item No.
0830-H-14 (MF)
- Sudoc No.
NAS 1.26:175178