- Additional Authors
- Description
- 1 microfiche (16, 3 unnumbered pages) : negative, illustrations; 11 x 15 cm.
- Summary
- Attenuators; beam splitters; carbon dioxide lasers; dielectric properties; Mach-Zehnder interferometers; reflectance; submillimeter waves.
- This study was initiated to i\536 instrument a system and to make measurements of the complex index of refraction in the wavelength region between 0.1 to 1.0 millimeters.
- Series Statement
- NASA-CR ; 175156
- Uniform Title
- NASA contractor report ; NASA-CR-175156.
- Alternative Title
- Instrumemtation and measurement of index of refraction
- Subject
- Note
- Bibliography (note)
- Includes bibliographical references (pages 7-9).
- Type of Report (note)
- Funding (note)
- Sponsored by the National Aeronautics and Space Administration
- Call Number
- GPO Microfiche NAS 1.26:175156
- OCLC
- marcive793520447
- Author
Lally, J., author.
- Title
Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction) / principal investigators: J. Lally and R. Meister.
- Publisher
[Washington, District of Columbia] : Department of Electrical Engineering, Catholic University of America : National Aeronautics and Space Administration, 11 July 1983.
- Type of Content
text
- Type of Medium
microform
- Type of Carrier
microfiche
- Series
NASA-CR ; 175156
NASA contractor report ; NASA-CR-175156.
- Bibliography
Includes bibliographical references (pages 7-9).
- Type Of Report
Final report; August 1977-August 1980.
- Funding
Sponsored by the National Aeronautics and Space Administration NSG-5111
- Added Author
Meister, R., author.
Catholic University of America. Department of Electrical Engineering, issuing body.
United States. National Aeronautics and Space Administration, sponsoring body.
- Other Form:
Onlien version: Lally, J. Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction) (OCoLC)890408997
- Gpo Item No.
0830-H-14 (MF)
- Sudoc No.
NAS 1.26:175156