- Additional Authors
- Frechette, Simon.
- Horst, John.
- Huang, Hui.
- Kramer, Thomas.
- Messina, E. R. (Elena R.)
- Proctor, Frederick M.
- Rippey, Bill.
- Scott, Harry.
- Vorburger, Ted.
- Wavering, Al.
- National Institute of Standards and Technology (U.S.)
- Description
- 1 online resource.
- Series Statement
- NISTIR ; 6847
- Uniform Title
- NISTIR ; 6847.
- Note
- 2001.
- Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
- Title from PDF title page.
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- GPO Internet C 13.58:6847
- LCCN
- GOVPUB-C13-771d966f43db1a1983d955168a8e5200
- OCLC
- marcive958933660
- Author
Evans, John.
- Title
Analysis of dimensional metrology standards / John Evans; Simon Frechette; John Horst; Hui Huang; Thomas Kramer; Elena Messina; Fred Proctor; Bill Rippey; Harry Scott; Ted Vorburger; Al Wavering.
- Publisher
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2001.
- Type of Content
text
- Type of Medium
computer
- Type of Carrier
online resource
- Series
NISTIR ; 6847
NISTIR ; 6847.
- Bibliography
Includes bibliographical references.
- Connect to:
- Added Author
Evans, John.
Frechette, Simon.
Horst, John.
Huang, Hui.
Kramer, Thomas.
Messina, E. R. (Elena R.)
Proctor, Frederick M.
Rippey, Bill.
Scott, Harry.
Vorburger, Ted.
Wavering, Al.
National Institute of Standards and Technology (U.S.)
- Other Standard Identifier
GOVPUB-C13-771d966f43db1a1983d955168a8e5200
- Gpo Item No.
0247-D (online)
- Sudoc No.
C 13.58:6847