- Additional Authors
- Description
- 1 online resource (39 pages) : illustrations (color).
- Series Statement
- NISTIR ; 8073
- Uniform Title
- NISTIR ; 8073.
- Subject
- Note
- Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
- July 2015.
- Title from PDF title page (viewed July 30, 2015).
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- GPO Internet C 13.58:8073
- LCCN
- GOVPUB-C13-79c5d97348df3788da6e3bb03483127e
- OCLC
- marcive921893552
- Author
Geist, Jon.
- Title
Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 : frequency offset, random, quantization, and jitter noise / Jon Geist; M. Yaqub Afridi.
- Publisher
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2015.
- Type of Content
text
- Type of Medium
computer
- Type of Carrier
online resource
- Series
NISTIR ; 8073
NISTIR ; 8073.
- Bibliography
Includes bibliographical references.
- Connect to:
- Added Author
Afridi, M. Yaqub.
Geist, Jon.
Physical Measurement Laboratory (National Institute of Standards and Technology (U.S.)). Semiconductor and Dimensional Metrology Division.
- Other Standard Identifier
GOVPUB-C13-79c5d97348df3788da6e3bb03483127e
- Gpo Item No.
0247-D (online)
- Sudoc No.
C 13.58:8073