Research Catalog

End-to-end Quality Information Framework (QIF) technology survey

Title
End-to-end Quality Information Framework (QIF) technology survey / John Michaloski; Tom Hedberg; Hui Huang; Thomas Kramer.
Author
Michaloski, John.
Publication
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.

Available Online

https://purl.fdlp.gov/GPO/gpo103834

Details

Additional Authors
  • Hedberg, Thomas M.
  • Huang, Hui.
  • Kramer, Thomas.
  • Michaloski, John.
  • National Institute of Standards and Technology (U.S.). Engineering Laboratory.
Description
1 online resource (32 pages) : illustrations (color).
Summary
The goal of this paper is to understand how quality information characterizing the manufactured parts can be reported in a XML standardized format. The Quality Information Framework (QIF) is an ANSI standard sponsored by the Dimensional Metrology Standards Consortium (DMSC) that defines an integrated set of XML information models to enable the effective exchange of metrology data throughout the entire manufacturing quality measurement process - from product design to inspection planning to execution to analysis and reporting. The desire is that QIF will help foster a pervasive digital thread throughout the product lifecycle contributing to feedforward and feedback flow of quality information. The hope is that widespread adoption of QIF will lead to better and more optimized part design and manufacturing processes performance.
Series Statement
NISTIR ; 8127
Uniform Title
NISTIR ; 8127.
Subject
  • Manufacturing processes
  • Quality control
Note
  • April 2016.
  • Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
  • Title from PDF title page (viewed April 30, 2016).
Bibliography (note)
  • Includes bibliographical references.
Call Number
GPO Internet C 13.58:8127
LCCN
GOVPUB-C13-da4e037714b436909a8a0b3effc25a9c
OCLC
marcive958885814
Author
Michaloski, John.
Title
End-to-end Quality Information Framework (QIF) technology survey / John Michaloski; Tom Hedberg; Hui Huang; Thomas Kramer.
Publisher
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.
Type of Content
text
Type of Medium
computer
Type of Carrier
online resource
Series
NISTIR ; 8127
NISTIR ; 8127.
Bibliography
Includes bibliographical references.
Connect to:
https://purl.fdlp.gov/GPO/gpo103834
Added Author
Hedberg, Thomas M.
Huang, Hui.
Kramer, Thomas.
Michaloski, John.
National Institute of Standards and Technology (U.S.). Engineering Laboratory.
Other Standard Identifier
GOVPUB-C13-da4e037714b436909a8a0b3effc25a9c
Gpo Item No.
0247-D (online)
Sudoc No.
C 13.58:8127
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