- Additional Authors
- Information Technology Laboratory (National Institute of Standards and Technology). Software and Systems Division.
- Description
- 1 online resource (32 pages) : illustrations (some color).
- Series Statement
- NIST technical note ; 1855
- Uniform Title
- NIST technical note ; 1855.
- Subject
- Note
- "October 2014."
- Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
- Title from PDF title page (viewed October 29, 2014).
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- GPO Internet C 13.46:1855
- LCCN
- GOVPUB-C13-c0870828e04c8f294d89abdcdf27cdc3
- OCLC
- marcive894517798
- Author
Flater, David.
- Title
Screening for factors affecting application performance in profiling measurements / David Flater.
- Publisher
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.
- Type of Content
text
- Type of Medium
computer
- Type of Carrier
online resource
- Series
NIST technical note ; 1855
NIST technical note ; 1855.
- Bibliography
Includes bibliographical references.
- Connect to:
- Added Author
Flater, David.
Information Technology Laboratory (National Institute of Standards and Technology). Software and Systems Division.
- Other Standard Identifier
GOVPUB-C13-c0870828e04c8f294d89abdcdf27cdc3
- Gpo Item No.
0249-A (online)
- Sudoc No.
C 13.46:1855