- Additional Authors
- Description
- 1 online resource.
- Series Statement
- NIST special publication ; 1012
- Uniform Title
- NIST special publication ; 1012.
- Note
- 2004.
- Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
- Title from PDF title page.
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- GPO Internet C 13.10:1012
- LCCN
- GOVPUB-C13-4deb8161f847bd340393baf9afc71507
- OCLC
- marcive926750888
- Author
Duewer, David L.
- Title
An approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials / David L. Duewer, Reenie M. Parris, Edward V. White, Willie E. May, Howard Elbaum.
- Publisher
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2004.
- Type of Content
text
- Type of Medium
computer
- Type of Carrier
online resource
- Series
NIST special publication ; 1012
NIST special publication ; 1012.
- Bibliography
Includes bibliographical references.
- Connect to:
- Added Author
Duewer, David L.
Elbaum, Howard.
May, Willie E.
Parris, Reenie M.
White, Edward V.
National Institute of Standards and Technology (U.S.)
- Other Standard Identifier
GOVPUB-C13-4deb8161f847bd340393baf9afc71507
- Gpo Item No.
0247 (online)
- Sudoc No.
C 13.10:1012