- Additional Authors
- Description
- 1 online resource.
- Series Statement
- NBS special publication ; 400-48
- Uniform Title
- NBS special publication ; 400-48.
- Note
- 1979.
- Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
- Title from PDF title page.
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- GPO Internet C 13.10:400-48
- LCCN
- GOVPUB-C13-214b9bc18cda152b19842a3588c5daf4
- OCLC
- marcive927169521
- Author
Dickey, David H.
- Title
Spreading resistance analysis for silicon layers with nonuniform resistivity / David H. Dickey, James R. Ehrstein.
- Publisher
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1979.
- Type of Content
text
- Type of Medium
computer
- Type of Carrier
online resource
- Series
NBS special publication ; 400-48
NBS special publication ; 400-48.
- Bibliography
Includes bibliographical references.
- Connect to:
- Added Author
Dickey, David H.
Ehrstein, James R.
United States. National Bureau of Standards.
- Other Standard Identifier
GOVPUB-C13-214b9bc18cda152b19842a3588c5daf4
- Gpo Item No.
0247 (online)
- Sudoc No.
C 13.10:400-48