- Additional Authors
- United States. National Bureau of Standards.
- Description
- 1 online resource.
- Series Statement
- NIST technical note ; 1390
- Uniform Title
- NIST technical note ; 1390.
- Subject
- Electronic noise > Measurement
- Note
- 1997.
- Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
- Title from PDF title page.
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- GPO Internet C 13.46:1390
- LCCN
- GOVPUB-C13-63b2423ef2215a1208e19d8a85899c72
- OCLC
- marcive929067533
- Author
Randa, James.
- Title
Noise temperature measurements on wafer / James. Randa.
- Publisher
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1997.
- Type of Content
text
- Type of Medium
computer
- Type of Carrier
online resource
- Series
NIST technical note ; 1390
NIST technical note ; 1390.
- Bibliography
Includes bibliographical references.
- Connect to:
- Added Author
Randa, James.
United States. National Bureau of Standards.
- Other Standard Identifier
GOVPUB-C13-63b2423ef2215a1208e19d8a85899c72
- Gpo Item No.
0249-A (online)
- Sudoc No.
C 13.46:1390