Research Catalog

Title

Total ionizing dose test report for the SFT2222A NPN bipolar junction transistor / Dakai Chen, James Forney.

Author

Chen, Dakai, 1982-

Publication

Greenbelt, Maryland : National Aeronautics and Space Administration, Goddard Space Flight Center, April 2021.

Details

Additional Authors

• Forney, James
• Goddard Space Flight Center, issuing body.

Description

1 online resource (approximately 22 pages) : illustrations.

Series Statement

NASA/TM ; 20210010530

Uniform Title

NASA technical memorandum ; 20210010530.

Subject

• Bipolar transistors
• Junction transistors

Note

• "April 2021."

Bibliography (note)

• Includes bibliographical references (page 5).

Source of Description (note)

• Description based on online resource, PDF version; title from title page (NASA, viewed on July 16, 2021).

Call Number

GPO Internet NAS 1.15:20210010530

OCLC

marcive1260302569

Author

Chen, Dakai, 1982- author.

Title

Total ionizing dose test report for the SFT2222A NPN bipolar junction transistor / Dakai Chen, James Forney.

Publisher

Greenbelt, Maryland : National Aeronautics and Space Administration, Goddard Space Flight Center, April 2021.

Type of Content

text

Type of Medium

computer

Type of Carrier

online resource

Series

NASA/TM ; 20210010530

NASA technical memorandum ; 20210010530.

Bibliography

Includes bibliographical references (page 5).

Connect to:

https://purl.fdlp.gov/GPO/gpo157757

Added Author

Forney, James, author.

Goddard Space Flight Center, issuing body.

Gpo Item No.

0830-D (online)

Sudoc No.

NAS 1.15:20210010530