- Additional Authors
- Description
- 1 online resource (5 pages) : color illustrations.
- Series Statement
- Conference paper / NREL ; NREL/CP-5K00-76041
- Uniform Title
- Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5K00-76041.
- Subject
- Note
- In scope of the U.S. Government Publishing Office Cataloging and Indexing Program (C&I) and Federal Depository Library Program (FDLP).
- "August 2020."
- "Presented at the 47th IEEE Photovoltaic Specialists Conference (PVSC 47), June 15-August 21, 2020"--Cover.
- Bibliography (note)
- Includes bibliographical references (page 5).
- Source of Description (note)
- Description based on online resource; title from PDF title page (NREL, viewed February 23, 2021).
- Call Number
- GPO Internet E 9.17:NREL/CP-5 K 00-76041
- OCLC
- marcive1371987549
- Author
Jiang, C.-S. (Chun-Sheng), author.
- Title
Local resistance measurement for degradation of c-Si heterojunction with intrinsic thin layer (HIT) solar modules : preprint / Chun-Sheng Jiang [and 6 others].
- Publisher
Golden, CO : National Renewable Energy Laboratory, August 2020.
- Type of Content
text
- Type of Medium
computer
- Type of Carrier
online resource
- Series
Conference paper / NREL ; NREL/CP-5K00-76041
Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5K00-76041.
- Bibliography
Includes bibliographical references (page 5).
- Funding
DE-AC36-08GO28308
- Connect to:
- Added Author
National Renewable Energy Laboratory (U.S.), issuing body.
United States. Department of Energy, sponsoring body.
- Gpo Item No.
0430-P-04 (online)
- Sudoc No.
E 9.17:NREL/CP-5 K 00-76041