Research Catalog
Chip-to-system test concerns for the 90's ; digest of papers, 1991 IEEE VLSI Test Symposium, April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA
- Title
- Chip-to-system test concerns for the 90's ; digest of papers, 1991 IEEE VLSI Test Symposium, April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA / sponsored by the IEEE Computer Society, Test Technology Technical Committee, and IEEE Philadelphia Section ; [Mukund U. Modi, general chairperson].
- Author
- IEEE VLSI Test Symposium (1991 : Atlantic City, N.J.)
- Publication
- New York, NY : IEEE, [1991], ©1991.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7874 .I325 1991g | Off-site |
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Details
- Additional Authors
- Description
- vii, 308 pages : illustrations; 28 cm
- Alternative Title
- Digest of papers.
- 1991 IEEE VLSI Test Symposium.
- Nineten ninety-one IEEE VLSI Test Symposium.
- IEEE Test Symposium, 1991.
- IEEE Test Symposium, nineteen ninety-one.
- Subjects
- Integrated circuits > Very large scale integration > Design and construction > Congresses
- Fault location (Engineering) > Congresses
- Computer simulation > Congresses
- Integrated circuits > Very large scale integration > Testing > Congresses
- Engineering design > Data processing > Congresses
- Testing > Methodology > Congresses
- Note
- "IEEE Test Symposium, 1991."
- "IEEE catalog number 91TH0353-3"--T.p. verso.
- Bibliography (note)
- Includes bibliographical references.
- ISBN
- 0780301889 (softbound)
- 0780301897 (microfiche)
- LCCN
- 90085699
- OCLC
- 25521432
- ocm25521432
- Owning Institutions
- Columbia University Libraries