Research Catalog

Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.

Title
Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.
Publication
Pittsburgh, Pa. : Materials Research Society, [1991], ©1991.

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Additional Authors
  • Lloyd, J. R. (James R.)
  • Yost, Frederick G.
  • Ho, P. S.
  • Materials Research Society.
  • MRS Symposium on Materials Reliability Issues in Microelectronics (1st : 1991 : Anaheim, Calif.)
Description
xiii, 358 pages : illustrations; 24 cm.
Series Statement
Materials Research Society symposium proceedings ; v. 225
Uniform Title
Materials Research Society symposia proceedings ; v. 225.
Subject
  • Microelectronics > Reliability > Congresses
  • Microelectronics > Testing > Congresses
  • Electrodiffusion > Congresses
  • Microstructure > Congresses
Note
  • Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics.
Bibliography (note)
  • Includes bibliogrpahical references and index.
ISBN
1558991190
LCCN
91030404
OCLC
  • 24429846
  • ocm24429846
Owning Institutions
Columbia University Libraries