Research Catalog

Proceedings of the symposia on reliability of semiconductor devices/interconnections and dielectric breakdown, and laser process for microelectronic applications

Title
Proceedings of the symposia on reliability of semiconductor devices/interconnections and dielectric breakdown, and laser process for microelectronic applications / edited by Hazara S. Rathore, G.S. Mathad, Du B. Nguyen.
Publication
Pennington, NJ : Electrochemical Society, [1992], ©1992.

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Details

Additional Authors
  • Mathad, G. S.
  • Nguyen, Du B.
  • Electrochemical Society. Dielectric Science and Technology Division.
  • Electrochemical Society. Electronics Division.
Description
viii, 330 pages : illustrations; 23 cm.
Series Statement
Proceedings ; v. 92-4
Uniform Title
Proceedings (Electrochemical Society) ; v. 92-4.
Alternative Title
Reliability of semiconductor devices/interconnections and dielectric breakdown and laser process for microelectronic applications.
Subjects
Note
  • "Dielectric Science & Technology and Electronics Divisions."
  • Spine title: Reliability of semiconductor devices/interconnections and dielectric breakdown and laser processes for microelectronic applications.
Bibliography (note)
  • Includes bibliographical references and indexes.
ISBN
1566770033
LCCN
92070488
OCLC
ocm26400274
Owning Institutions
Columbia University Libraries