Research Catalog

Title

Characterization of metals and alloys / editors, Pauk H. Holloway and P.N. Vaidyanathan ; managing editor, Lee E. Fitzpatrick.

Publication

Boston : Butterworth-Heinemann ; Greenwich : Manning, [1993], ©1993.

Items in the Library & Off-site

Holdings

Details

Additional Authors

• Holloway, Paul H.
• Vaidyanathan, P. N.

Description

xiv, 309 pages : illustrations; 25 cm.

Series Statement

Materials characterization series

Uniform Title

Materials characterization series.

Subjects

• Alloys
• Metals

Bibliography (note)

• Includes bibliographical references and index.

Contents

• Acronyms Glossary. 1.1. Purpose and Organization of the Book -- Mechanical Properties and Interfacial Analysis. 2.2. Grain Boundary Segregation. 2.3. Temper Embrittlement. 2.4. Corrosion and Stress Corrosion Cracking. 2.5. Hydrogen Embrittlement. 2.6. Creep Embrittlement. 2.7. Future Directions -- Chemical Properties. 3.2. Tools of the Trade - Unique Information Available. 3.3. Gaseous Corrosion. 3.4. Aqueous Corrosion. 3.5. Surface Electronic Structure and Chemistry. 3.6. Surface Modification -- Surface and Thin Film Analysis of Diffusion in Metals. 4.2. The Mathematics of Diffusion. 4.3. Effects of Non-Uniform Cross Sections. 4.4. Effects of Finite Thickness. 4.5. Analysis Techniques for Diffusion. 4.6. Case Studies of Diffusion -- Mineral Processing and Metal Reclamation. 5.2. Techniques for Mineral Surface Characterization. 5.3. Surface Bonding in Mineral-Fluid Systems. 5.4. Complementary Composition Analyses of Rough and Polished Surfaces -- Melting and Casting.
• 6.2. Aluminum-Lithium Alloys. 6.3. Aluminum-Magnesium Alloys. 6.4. Rapidly Solidified Aluminum Alloy Powders. 6.5. Cast Aluminum Alloy Metal Matrix Composites. 6.6. Liquid Aluminum Alloys -- Machining and Working of Metals. 7.2. Physical and Chemical Characterization. 7.3. Lubrication. 7.4. Surface Finish. 7.5. Metalworking Example -- Characterization of the Cleaning of Surfaces of Metals and Metal Alloys. 8.2. Characterization of Cleaning Procedures. 8.3. Specimen Handling and Interpretation of Data -- Coatings and Thin Films. 9.2. Techniques for Creating Coatings and Thin Films. 9.3. Techniques to Characterize Coatings and Thin Films. 9.4. Studies of Coatings on Metals. 9.5. Studies of Thin Films on Metals -- Failure Analysis. 10.2. Collaboration with the Applications Engineering Team. 10.3. Failure Analysis Case Histories -- Appendixes: Techniques Summaries -- 1 Auger Electron Spectroscopy (AES) -- 2 Cathodoluminescence (CL).
• 3 Dynamic Secondary Ion Mass Spectrometry (Dynamic SIMS) -- 4 Elastic Recoil Spectrometry (ERS) -- 5 Electron Energy-Loss Spectroscopy in the Transmission Electron Microscope (EELS) -- 6 Electron Probe X-Ray Microanalysis (EPMA) -- 7 Energy-Dispersive X-Ray Spectroscopy (EDS) -- 8 Extended X-Ray Absorption Fine Structure (EXAFS) -- 9 Field Ion Microscopy (FIM) -- 10 Fourier Transform Infrared Spectroscopy (FTIR) -- 11 Glow-Discharge Mass Spectrometry (GDMS) -- 12 High-Resolution Electron Energy Loss Spectroscopy (HREELS) -- 13 Inductively Coupled Plasma Mass Spectrometry (ICPMS) -- 14 Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES) -- 15 Ion Scattering Spectroscopy (ISS) -- 16 Laser Ionization Mass Spectrometry (LIMS) -- 17 Low-Energy Electron Diffraction (LEED) -- 18 Low-Energy Electron Microscopy (LEEM) -- 19 Magneto-Optic Kerr Effect (MOKE) -- 20 Medium-Energy Ion Scattering with Channeling and Blocking (MEIS) -- 21 Neutron Activation Analysis (NAA).
• 22 Nuclear Reaction Analysis (NRA) -- 23 Optical Micro-Reflectometry (OMR) and Differential Reflectometry (DR) -- 24 Optical Second Harmonic Generation (SHG) -- 25 Particle-Induced X-Ray Emission (PIXE) -- 26 Photoacoustic Spectroscopy (PAS) -- 27 Photoelectron Emission Microscopy (PEEM) -- 28 Photoluminescence (PL) -- 29 Reflected Electron Energy-Loss Spectroscopy (REELS) -- 30 Reflection High-Energy Electron Diffraction (RHEED) -- 31 Rutherford Backscattering Spectrometry (RBS) -- 32 Scanning Electron Microscopy (SEM) -- 33 Scanning Transmission Electron Microscopy (STEM) -- 34 Scanning Tunneling Microscopy and Scanning Force Microscopy (STM and SFM) -- 35 Solid State Nuclear Magnetic Resonance (NMR) -- 36 Spark Source Mass Spectrometry (SSMS) -- 37 Sputtered Neutral Mass Spectrometry (SNMS) -- 38 Static Secondary Ion Mass Spectrometry (Static SIMS) -- 39 Surface Analysis by Laser Ionization (SALI).
• 40 Surface Extended X-Ray Absorption Fine Structure and Near Edge X-Ray Absorption Fine Structure (SEXAFS/NEXAFS) -- 41 Temperature Programmed Desorption (TPD) -- 42 Total Reflection X-Ray Fluorescence Analysis (TXRF) -- 43 Transmission Electron Microscopy (TEM) -- 44 Ultraviolet Photoelectron Spectroscopy (UPS) -- 45 Variable-Angle Spectroscopic Ellipsometry (VASE) -- 46 X-Ray Diffraction (XRD) -- 47 X-Ray Fluorescence (XRF) -- 48 X-Ray Photoelectron Diffraction (XPD) and Auger Electron Diffraction (AED) -- 49 X-Ray Photoelectron Spectroscopy (XPS).

ISBN

0750692464 (hc : alk. paper)

LCCN

92035444

OCLC

• 26763133
• ocm26763133

Owning Institutions

Columbia University Libraries