Research Catalog

Digest of papers : eleventh annual, 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey; sponsored by the IEEE Computer Society, Technical Committee--Test Technology, Philadelphia Section of the IEEE.

Title
Digest of papers : eleventh annual, 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey; sponsored by the IEEE Computer Society, Technical Committee--Test Technology, Philadelphia Section of the IEEE.
Author
IEEE VLSI Test Symposium (11th : 1993 : Atlantic City, N.J.)
Publication
[New York] : The Society : Institute of Electrical and Electronics Engineers, [1993], ©1993.

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Details

Additional Authors
  • IEEE Computer Society. Test Technology Technical Committee.
  • Institute of Electrical and Electronics Engineers. Philadelphia Section.
Description
xiii, 365 pages : illustrations; 28 cm
Alternative Title
Design, test, and application: systems on silicon.
Subject
  • Application-specific integrated circuits > Congresses
  • Application-specific integrated circuits > Testing > Congresses
  • Application-specific integrated circuits > Design > Congresses
Note
  • "IEEE catalog number 93TH0537-1"--T.p. verso.
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
  • 0818638303 (paper)
  • 0818638301 (microfiche) (canceled/invalid)
LCCN
93077453
OCLC
ocm28687294
Owning Institutions
Columbia University Libraries