Research Catalog
Digital integrated circuit testing from a quality perspective
- Title
- Digital integrated circuit testing from a quality perspective / Eugene R. Hnatek.
- Author
- Hnatek, Eugene R.
- Publication
- New York : Van Nostrand Reinhold, [1993], ©1993.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7874 .H533 1993 | Off-site |
Holdings
Details
- Description
- x, 179 pages : illustrations; 24 cm
- Subject
- Digital integrated circuits > Quality control
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 0442006438
- LCCN
- 93013739
- OCLC
- ocm28111381
- Owning Institutions
- Columbia University Libraries