Research Catalog

Electron beam testing technology

Title
Electron beam testing technology / edited by John T.L. Thong.
Publication
New York : Plenum Press, [1993], ©1993.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
Request for On-site UseRequest Scan
How do I pick up this item and when will it be ready?
TextRequest in advance TK7871.85 .E426 1993Off-site

Holdings

Details

Additional Authors
Thong, John T. L.
Description
xvi, 462 pages : illustrations; 26 cm.
Series Statement
Microdevices
Uniform Title
Microdevices.
Subjects
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0306443600
LCCN
93018555
OCLC
ocm27725615
Owning Institutions
Columbia University Libraries