Research Catalog
Characterization in silicon processing
- Title
- Characterization in silicon processing / editor, Yale Strusser.
- Publication
- Boston : Butterworth-Heinemann ; Greenwich : Manning, 1993.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | QC611.8.S5 C48 1993 | Off-site |
Holdings
Details
- Additional Authors
- Strausser, Yale.
- Description
- xiii, 240 pages : illustrations; 25 cm.
- Series Statement
- Materials characterization series
- Uniform Title
- Materials characterization series.
- Subject
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 0750691727
- LCCN
- 93022784
- OCLC
- 28221484
- ocm28221484
- Owning Institutions
- Columbia University Libraries