Research Catalog

Title

Semiconductor interfaces, microstructures and devices : properties and applications / edited by Zhe Chuan Feng.

Publication

Bristol ; Philadelphia : Institute of Physics Pub., [1993], ©1993.

Items in the Library & Off-site

Holdings

Details

Additional Authors

Feng, Zhe Chuan.

Description

xiv, 293 pages : illustrations; 24 cm

Subjects

• Semiconductors > Surfaces
• Superlattices as materials
• Compound semiconductors > Surfaces

Bibliography (note)

• Includes bibliographical references.

Contents

• Preface / Z. C. Feng -- 1. Electric field induced localization in superlattices / R. Tsu -- 2. Intersubband transitions and quantum well infrared photodetectors / K. K. Choi -- 3. Real-time spectroscopic ellipsometry monitoring of semiconductor growth and etching / R. W. Collins, I. An, A. R. Heyd, Y. M. Li and C. R. Wronski -- 4. X-ray reflectivity from heteroepitaxial layers / P. F. Miceli -- 5. Spontaneous and stimulated emissions from optical microcavity structures / H. Yokoyama, S. D. Brorson, E. P. Ippen, K. Nishi, T. Anan, M. Suzuki and Y. Nambu -- 6. Radiative and nonradiative recombination in AlGaAs and InGaAsP heterostructures and some features of the corresponding quantum well laser diodes / Zh. I. Alferov and D. Z. Garbuzov -- 7. Far-infrared cyclotron resonance of a two-dimensional electron gas in III-V semiconductor heterostructures / M. O. Manasreh -- 8. Optics in lower-dimensional quantum confined II-VI heterostructures / A. V. Nurmikko and R. L. Gunshor.
• 9. Growth and doping of silicon by low-temperature molecular beam epitaxy / H.-J. Gossmann and D. J. Eaglesham -- 10. Point defects and charge traps in the Si/SiO[subscript 2] system and related structures / E. H. Poindexter -- 11. Growth and characterization of silicon carbide polytypes for electronic applications / J. A. Powell, P. Pirouz and W. J. Choyke.

ISBN

0750301805 :

LCCN

93022147

OCLC

• 28294945
• ocm28294945

Owning Institutions

Columbia University Libraries