Research Catalog
Electromigration and electronic device degradation
- Title
- Electromigration and electronic device degradation / edited by Aris Christou.
- Publication
- New York, NY, USA : Wiley, [1994], ©1994.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7874 .E477 1994 | Off-site |
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Details
- Additional Authors
- Christou, A.
- Description
- xiv, 343 pages : illustrations; 24 cm
- Subjects
- Bibliography (note)
- Includes bibliographical references and index.
- Contents
- 1. Reliability and Electromigration Degradation of GaAs Microwave Monolithic Integrated Circuits / Aris Christou -- 2. Simulation and Computer Models for Electromigration / Pin Fang Tang -- 3. Temperature Dependencies on Electromigration / Michael Pecht and Pradeep Lall -- 4. Electromigration and Related Failure Mechanisms in VLSI Metallizations / Aris Christou and M. C. Peckerar -- 5. Metallic Electromigration Phenomena / Simeon J. Krumbein -- 6. Theoretical and Experimental Study of Electromigration / Jian Hui Zhao -- 7. GaAs on Silicon Performance and Reliability / P. Panayotatos, A. Georgakilas and N. Kornilios -- 8. Electromigration and Stability of Multilayer Metal-Semiconductor Systems on GaAs / Aris Christou -- 9. Electrothermomigration Theory and Experiments in Aluminum Thin Film Metallizations / Aris Christou -- 10. Reliable Metallization for VLSI / M. C. Peckerar.
- ISBN
- 0471584894 (cloth : alk. paper)
- LCCN
- 93016841
- OCLC
- 27771020
- ocm27771020
- Owning Institutions
- Columbia University Libraries